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High Speed Shunt Detection Tau Science’s IRIS system rapidly and reliably detects shunts (hot-spots) in the cell manufacturing line, ensuring that defective cells do not get built into modules.  IRIS is fully exportable under ITAR, is designed for integration into the manufacturing line, and includes an easy to operate data review and analysis software.  A stand-alone, laboratory version is also available.
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Fully Integrated Software Hot spot defect detection is controlled through a user configurable recipe and control limits which dispositions the cell into Pass, Fail, or Marginal bins in less than two seconds.  By integrating the IRIS module onto cell sorting equipment (via an included Factory Interface), cells can be sorted to separate cells with well distributed shunts from those with concentrated shunts that may lead to overheating and module failure in the field.
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