Tau Science Corporation develops high speed characterization tools for photovoltaic cell manufacturers. Our systems are used to improve process yield by providing relevant information in real-time to Engineering and Production staff. We specialize in defect detection and cell performance monitoring and leverage our expertise in photovoltaic device characterization and semiconductor capital equipment design to produce world-class PV test equipment.

Tau is now running demonstrations of IRIS, a novel inline detector capable of locating process critical electrical defects at the speed of the manufacturing line (less than one second). Please contact us if you would like a demonstration of this capability.